SEMI E10 and SEMI E79 are the two most widely used equipment performance metrics Specification Standards in the semiconductor and other related high-tech areas. SEMI E10 provides the methodologies needed for measuring and evaluating equipment reliability, availability, and maintainability (RAM) and utilization performance. SEMI E79 provides the methodologies needed for measuring and evaluating the productivity of equipment, using metrics such as overall equipment efficiency (OEE) and throughput. These Standards play a critical role in the everyday operations in manufacturing facilities, such as wafer fabs, around the world. In response to many questions on how to correctly apply SEMI E10 and E79, the SEMI Standards Equipment Reliability, Availability, Maintainability, and Productivity (RAMP) Task Force released this free webinar which serves to enhance the application and correct usage of the current SEMI E10 and E79 Standards.
| COURSE TITLE | SEMI Standards Educational Series for E10 and E79 |
| COURSE PLATFORM | Vimeo |
| COURSE WEB | https://www.semi.org/en/products-services/standards/step/equipment-performance-metrics |
| ACCESS INFORMATION | https://www.semi.org/en/products-services/standards/step/equipment-performance-metrics |
| PROVIDER INSTITUTION | SEMI |
| PROVIDER CONTACT | name: Laura Nguyen, Paul Trio email: lnguyen@semi.org, ptrio@semi.org |
| TEACHERS | T1- David Bouldin T2- David Busing T3- Steven J Meyer |
| TYPE OF COURSE | ☒ On-line (stand-alone) |
| DATES EXPECTED OPENING | Available now |
| DATES AVAILABILITY | ☒ 365 days accessible |
| WORKLOAD STUDENT (in hours) | ~4 hours |
| TYPE OF TRAINING | ☒ Work-based training |
| EQF LEVELS | ☒ EQF 3 |
| LANGUAGES | ☒ English |
| MAIN SUBJECT | ☒ Fundamentals of microelectronics manufacturing |
| COURSE DESCRIPTION | SEMI E10 and SEMI E79 are the two most widely used equipment performance metrics Specification Standards in the semiconductor and other related high-tech areas. SEMI E10 provides the methodologies needed for measuring and evaluating equipment reliability, availability, and maintainability (RAM) and utilization performance. SEMI E79 provides the methodologies needed for measuring and evaluating the productivity of equipment, using metrics such as overall equipment efficiency (OEE) and throughput. These Standards play a critical role in the everyday operations in manufacturing facilities, such as wafer fabs, around the world. In response to many questions on how to correctly apply SEMI E10 and E79, the SEMI Standards Equipment Reliability, Availability, Maintainability, and Productivity (RAMP) Task Force released this free webinar which serves to enhance the application and correct usage of the current SEMI E10 and E79 Standards. |
| KEYWORDS | KW1- standards KW2- E10 KW3- E79 KW4 – equipment productivity KW5 – equipment metrics KW6 – equipment reliability KW7 – equipment availability KW8 – equipment maintainability KW9 – equipment efficiency KW10 – metrics KW11 – factory automation KW12 – SEMI Standards |
| LEARNING OBJECTIVES | This webinar serves to enhance the application and correct usage of the current SEMI E10 and E79 Standards. |
| PREREQUISITES |